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1 Ergebnisse
1
Online Junction Temperature Extraction With Gate Voltage fo..:
, In:
2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS)
,
Chen, Zhong
;
Yang, Wei
;
Hu, Di
... - p. 1670-1675 , 2023
Link:
https://doi.org/10.1109/PEAS58692.2023.10395414
RT T1 <cTitle>2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS)</cTitle>: T1 <Title>Online Junction Temperature Extraction With Gate Voltage for Thyristor Considering the Pressure Variation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10395414&Exemplar=1&LAN=DE A1 Chen, Zhong A1 Yang, Wei A1 Hu, Di A1 Guan, Weiping A1 Xie, Jia A1 Luo, Haoze YR 2023 K1 Temperature measurement K1 Temperature sensors K1 Thyristors K1 Voltage measurement K1 High-voltage techniques K1 Logic gates K1 Reliability theory K1 gate voltage K1 junction temperature K1 online monitor K1 thyristor K1 pressure SP 1670 OP 1675 LK http://dx.doi.org/https://doi.org/10.1109/PEAS58692.2023.10395414 DO https://doi.org/10.1109/PEAS58692.2023.10395414 SF ELIB - SuUB Bremen
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