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Recoverable Current Collapse Effect of p-GaN HEMTs Under Sh..:

, In: 2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS),
Wang, Meng ; Li, Xiangdong ; Zhang, Jincheng... - p. 141-144 , 2023
Link: https://doi.org/10.1109/PEAS58692.2023.10395456