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A simulation study about the memory operation of 3D-stacked..:
, In:
2023 20th International SoC Design Conference (ISOCC)
,
Kim, Taegun
;
Lee, Dong Keun
;
Kim, Sihyun
. - p. 135-136 , 2023
Link:
https://doi.org/10.1109/ISOCC59558.2023.10396222
RT T1 <cTitle>2023 20th International SoC Design Conference (ISOCC)</cTitle>: T1 <Title>A simulation study about the memory operation of 3D-stacked capacitor-less 1T DRAM cells based on ferroelectric field-effect transistors (FeFETs)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10396222&Exemplar=1&LAN=DE A1 Kim, Taegun A1 Lee, Dong Keun A1 Kim, Sihyun A1 Kim, Sangwan YR 2023 SN 2472-9655 K1 Design automation K1 Capacitors K1 Random access memory K1 Voltage K1 Transistors K1 FeFETs K1 FeFET K1 3D DRAM K1 1T DRAM SP 135 OP 136 LK http://dx.doi.org/https://doi.org/10.1109/ISOCC59558.2023.10396222 DO https://doi.org/10.1109/ISOCC59558.2023.10396222 SF ELIB - SuUB Bremen
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