I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Signal integrity analysis of heterogeneous integration usin..:
, In:
2023 20th International SoC Design Conference (ISOCC)
,
Koh, Yong-Nam
;
Kim, Ju-Hyung
;
Kim, Soo-Jeong
... - p. 221-222 , 2023
Link:
https://doi.org/10.1109/ISOCC59558.2023.10396233
RT T1 <cTitle>2023 20th International SoC Design Conference (ISOCC)</cTitle>: T1 <Title>Signal integrity analysis of heterogeneous integration using Si bridge technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10396233&Exemplar=1&LAN=DE A1 Koh, Yong-Nam A1 Kim, Ju-Hyung A1 Kim, Soo-Jeong A1 Jang, Ju-Hwan A1 Lim, Jae-Sung A1 Kim, Jayden Donghyun YR 2023 SN 2472-9655 K1 Bridges K1 Wiring K1 Integrated circuits K1 Simulation K1 Multichip modules K1 Bandwidth K1 Trademarks K1 2.5D advanced packaging technology K1 Heterogeneous Integration K1 Silicon Bridge K1 Neural Processing Unit K1 High Bandwidth Memory K1 Signal Integrity K1 Electrical simulation SP 221 OP 222 LK http://dx.doi.org/https://doi.org/10.1109/ISOCC59558.2023.10396233 DO https://doi.org/10.1109/ISOCC59558.2023.10396233 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
