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1 Ergebnisse
1
Enhancing Temperature Immunity of Digital Circuit Against A..:
, In:
2023 IEEE 15th International Conference on ASIC (ASICON)
,
Zheng, Mingyue
;
Chen, Wangyong
;
Lyu, Yaoyang
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ASICON58565.2023.10396237
RT T1
2023 IEEE 15th International Conference on ASIC (ASICON)
: T1
Enhancing Temperature Immunity of Digital Circuit Against Aging : The Standard Cell Subset Method
UL https://suche.suub.uni-bremen.de/peid=ieee-10396237&Exemplar=1&LAN=DE A1 Zheng, Mingyue A1 Chen, Wangyong A1 Lyu, Yaoyang A1 Chen, Haifeng A1 Chen, Jiahui A1 Cai, Linlin YR 2023 SN 2162-755X K1 Temperature distribution K1 Aging K1 Libraries K1 Stability analysis K1 Standards K1 Digital circuits K1 Thermal stability K1 zero temperature delay K1 digital circuit K1 aging K1 BTI K1 standard cell library SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ASICON58565.2023.10396237 DO https://doi.org/10.1109/ASICON58565.2023.10396237 SF ELIB - SuUB Bremen
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