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Numerical Characterization of a 5-Layer (Pt/Ta/TaO/AlO/W) R..:

, In: 2023 IEEE 15th International Conference on ASIC (ASICON),
Li, Jiahao ; Yang, Wanlan ; Zhou, Xing - p. 1-4 , 2023
Link: https://doi.org/10.1109/ASICON58565.2023.10396452