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1 Ergebnisse
1
Comprehensive Comparison of Temperature Performances for Si..:
, In:
2023 IEEE 15th International Conference on ASIC (ASICON)
,
Yi, Bo
;
Huang, HaiMeng
;
Hu, HaoRan
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ASICON58565.2023.10396464
RT T1 <cTitle>2023 IEEE 15th International Conference on ASIC (ASICON)</cTitle>: T1 <Title>Comprehensive Comparison of Temperature Performances for SiC Trench MOSFET with Integrated Side-wall Schottky Diode and Heterojunction</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10396464&Exemplar=1&LAN=DE A1 Yi, Bo A1 Huang, HaiMeng A1 Hu, HaoRan A1 Kong, MouFu A1 Guo, YiLin A1 Shi, WenKun A1 Cheng, JunJi A1 Yang, HongQiang YR 2023 SN 2162-755X K1 Performance evaluation K1 Schottky diodes K1 MOSFET K1 Silicon carbide K1 Switches K1 Heterojunctions K1 Leakage currents K1 SiC K1 Trench MOS K1 Heterojunction K1 SBD K1 high temperature SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ASICON58565.2023.10396464 DO https://doi.org/10.1109/ASICON58565.2023.10396464 SF ELIB - SuUB Bremen
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