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Characterisation Stress Tests of Low Gain Avalanche Diodes:

, In: 2022 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC),
Azzarello, P. ; Barone, G. ; Boye, D.... - p. 1-5 , 2022
Link: https://doi.org/10.1109/NSS/MIC44845.2022.10398932