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Electronics and 3He Counter Acquisition Tests During the Pu..:

, In: 2022 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC),
Fondement, V. ; Perot, B. ; Marchais, T.... - p. 1-6 , 2022
Link: https://doi.org/10.1109/NSS/MIC44845.2022.10399200