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1 Ergebnisse
1
A Study on the Hydrogen Effect and Reliability of a Depleti..:
, In:
2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)
,
Zhao, Dongsheng
;
Liu, Luchuan
;
Chu, Meirong
... - p. 263-266 , 2023
Link:
https://doi.org/10.1109/SSLChinaIFWS60785.2023.1039974
RT T1 <cTitle>2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)</cTitle>: T1 <Title>A Study on the Hydrogen Effect and Reliability of a Depletion-Mode AlGaN/GaN MISFET Device</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10399740&Exemplar=1&LAN=DE A1 Zhao, Dongsheng A1 Liu, Luchuan A1 Chu, Meirong A1 He, Zhiyuan A1 Wu, Lijuan A1 Shi, Yijun A1 Jiang, Xingchuan A1 Cheng, Zijun A1 Lv, Mingen A1 He, Liang A1 Liu, Chang YR 2023 K1 MISFETs K1 Hydrogen K1 Threshold voltage K1 Wide band gap semiconductors K1 Low-frequency noise K1 Voltage control K1 MODFETs SP 263 OP 266 LK http://dx.doi.org/https://doi.org/10.1109/SSLChinaIFWS60785.2023.10399740 DO https://doi.org/10.1109/SSLChinaIFWS60785.2023.10399740 SF ELIB - SuUB Bremen
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