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1 Ergebnisse
1
Electrical Characteristics Analysis of AlGaN/GaN FinFET and..:
, In:
2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)
,
Zhang, Yichi
;
Wen, Huiqing
;
Qu, Zifeng
.. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/SSLChinaIFWS60785.2023.1039975
RT T1 <cTitle>2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)</cTitle>: T1 <Title>Electrical Characteristics Analysis of AlGaN/GaN FinFET and TSEP Junction Temperature Test of GaN Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10399757&Exemplar=1&LAN=DE A1 Zhang, Yichi A1 Wen, Huiqing A1 Qu, Zifeng A1 Liu, Tianran A1 Jiang, Yizhou YR 2023 K1 Temperature measurement K1 Temperature K1 Three-dimensional displays K1 Photonic band gap K1 Logic gates K1 FinFETs K1 Software K1 Junction temperature K1 TSEP K1 GaN FinFET K1 short channel effect K1 Silvaco TCAD SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/SSLChinaIFWS60785.2023.10399757 DO https://doi.org/10.1109/SSLChinaIFWS60785.2023.10399757 SF ELIB - SuUB Bremen
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