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1 Ergebnisse
1
A Gate Current Detection for Short-Circuit Protection of Si..:
, In:
2023 IEEE 4th China International Youth Conference On Electrical Engineering (CIYCEE)
,
Hu, Bo
;
Ke, Zipeng
;
He, Minmin
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/CIYCEE59789.2023.10401650
RT T1
2023 IEEE 4th China International Youth Conference On Electrical Engineering (CIYCEE)
: T1
A Gate Current Detection for Short-Circuit Protection of SiC MOSFET
UL https://suche.suub.uni-bremen.de/peid=ieee-10401650&Exemplar=1&LAN=DE A1 Hu, Bo A1 Ke, Zipeng A1 He, Minmin A1 Zhang, Chao A1 Liu, Zeng A1 Wang, Jun YR 2023 K1 MOSFET K1 Silicon carbide K1 Switches K1 Logic gates K1 Circuit faults K1 Velocity measurement K1 Switching circuits K1 Short-circuit Protection K1 Hard Switching Fault K1 Fault Under Load SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/CIYCEE59789.2023.10401650 DO https://doi.org/10.1109/CIYCEE59789.2023.10401650 SF ELIB - SuUB Bremen
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