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1 Ergebnisse
1
Study of parametric variations on Heterojunction Dual Gate ..:
, In:
2023 IEEE Silchar Subsection Conference (SILCON)
,
Nasani, Karthik
;
Bhowmick, Brinda
;
Pukhrambam, Puspa Devi
- p. 1-6 , 2023
Link:
https://doi.org/10.1109/SILCON59133.2023.10405010
RT T1
2023 IEEE Silchar Subsection Conference (SILCON)
: T1
Study of parametric variations on Heterojunction Dual Gate Vertical TFET for performance Enhancement
UL https://suche.suub.uni-bremen.de/peid=ieee-10405010&Exemplar=1&LAN=DE A1 Nasani, Karthik A1 Bhowmick, Brinda A1 Pukhrambam, Puspa Devi YR 2023 K1 TFETs K1 Simulation K1 Logic gates K1 Tunneling K1 Ions K1 Capacitance K1 Next generation networking K1 band-to-band tunnelling (BTBT) K1 InP/ In0.47Ga0.53As heterojunction K1 dual material gate SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/SILCON59133.2023.10405010 DO https://doi.org/10.1109/SILCON59133.2023.10405010 SF ELIB - SuUB Bremen
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