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GaN HEMT Small-Signal Modeling Using an Optimization Strate..:

, In: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE),

Cai, Jialin ; Gugliandolo, Giovanni ; Marinkovic, Zlatica... - p. 422-426 , 2023

Link: https://doi.org/10.1109/MetroXRAINE58569.2023.10405657

RT 
T1 <cTitle>2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)</cTitle>: T1 <Title>GaN HEMT Small-Signal Modeling Using an Optimization Strategy Based on Gated Recurrent Unit Networks</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10405657&Exemplar=1&LAN=DE
				
A1 Cai, Jialin
A1 Gugliandolo, Giovanni
A1 Marinkovic, Zlatica
A1 Latino, Mariangela
A1 Fazio, Enza
A1 Bosi, Gianni
A1 Raffo, Antonio
A1 Crupi, Giovanni
A1 Donato, Nicola
YR 2023
K1 Temperature measurement
K1 Semiconductor device modeling
K1 Performance evaluation
K1 Semiconductor device measurement
K1 Current measurement
K1 Logic gates
K1 Frequency measurement
K1 Active electronic device
K1 gated recurrent unit
K1 optimization
K1 mm-wave frequencies
K1 modeling
K1 scattering parameter measurements
K1 semiconductor
SP 422
OP 426
LK http://dx.doi.org/https://doi.org/10.1109/MetroXRAINE58569.2023.10405657
DO https://doi.org/10.1109/MetroXRAINE58569.2023.10405657
SF ELIB - SuUB Bremen

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