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1 Ergebnisse
1
Artificial Intelligence for Automotive Security: How to Sup..:
, In:
2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
,
Barletta, Vita Santa
;
Catalano, Christian
;
De Vincentiis, Mirko
.. - p. 954-959 , 2023
Link:
https://doi.org/10.1109/MetroXRAINE58569.2023.10405720
RT T1 <cTitle>2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)</cTitle>: T1 <Title>Artificial Intelligence for Automotive Security: How to Support Developers in Automotive Solutions</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10405720&Exemplar=1&LAN=DE A1 Barletta, Vita Santa A1 Catalano, Christian A1 De Vincentiis, Mirko A1 Pal, Anibrata A1 Scalera, Michele YR 2023 K1 Training K1 Machine learning algorithms K1 Taxonomy K1 Software algorithms K1 Security K1 Computer crime K1 Automotive engineering K1 Artificial Intelligence K1 Quantum Annealing K1 Automotive K1 Cybersecurity K1 Machine Learning SP 954 OP 959 LK http://dx.doi.org/https://doi.org/10.1109/MetroXRAINE58569.2023.10405720 DO https://doi.org/10.1109/MetroXRAINE58569.2023.10405720 SF ELIB - SuUB Bremen
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