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1 Ergebnisse
1
An Improved Single-Temperature Trim Technique for 1st Order..:
, In:
2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS)
,
Adjei, Daniel
;
Gadogbe, Bryce
;
Chen, Degang
... - p. 59-63 , 2023
Link:
https://doi.org/10.1109/MWSCAS57524.2023.10405982
RT T1 <cTitle>2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS)</cTitle>: T1 <Title>An Improved Single-Temperature Trim Technique for 1st Order-Compensated Bandgap References</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10405982&Exemplar=1&LAN=DE A1 Adjei, Daniel A1 Gadogbe, Bryce A1 Chen, Degang A1 Geiger, Randall A1 Chaganti, Shravan K. A1 Desai, Dhyey A1 Doorenbos, Jerry A1 Todsen, Jim YR 2023 SN 1558-3899 K1 Costs K1 Photonic band gap K1 Circuits and systems K1 Simulation K1 Voltage K1 CMOS process K1 Standards K1 bandgap voltage references K1 trimming K1 temperature coefficient (TC) K1 single-trim K1 machine learning K1 linear regression SP 59 OP 63 LK http://dx.doi.org/https://doi.org/10.1109/MWSCAS57524.2023.10405982 DO https://doi.org/10.1109/MWSCAS57524.2023.10405982 SF ELIB - SuUB Bremen
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