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A New Method for Classifying High Speed Chip Using Machine ..:

, In: 2023 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM),
Ahn, J. E. ; Choi, J. H. ; Park, J. S... - p. 0239-0243 , 2023
Link: https://doi.org/10.1109/IEEM58616.2023.10406749