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Attention Mechanism-Based Deep Learning Denoising of Scanne..:

, In: 2023 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM),
Zuo, L. L. ; Zhang, J. ; Ding, S. L.. - p. 1682-1686 , 2023
Link: https://doi.org/10.1109/IEEM58616.2023.10407020