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1 Ergebnisse
1
Dynamic Characterization of 650V GaN HEMT Transistors:
, In:
2023 IEEE 8th Southern Power Electronics Conference and 17th Brazilian Power Electronics Conference (SPEC/COBEP)
,
Sergentanis, Grigorios
;
De Novaes, Yales Romulo
;
De Lillo, Liliana
.. - p. 1-7 , 2023
Link:
https://doi.org/10.1109/SPEC56436.2023.10407647
RT T1 <cTitle>2023 IEEE 8th Southern Power Electronics Conference and 17th Brazilian Power Electronics Conference (SPEC/COBEP)</cTitle>: T1 <Title>Dynamic Characterization of 650V GaN HEMT Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10407647&Exemplar=1&LAN=DE A1 Sergentanis, Grigorios A1 De Novaes, Yales Romulo A1 De Lillo, Liliana A1 Empringham, Lee A1 Johnson, Mark C. YR 2023 SN 2832-2983 K1 Performance evaluation K1 Switching loss K1 Switches K1 HEMTs K1 Loss measurement K1 Transistors K1 Gallium nitride K1 GaN K1 Device Characterization K1 Dynamic Characterization K1 Double Pulse Test SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/SPEC56436.2023.10407647 DO https://doi.org/10.1109/SPEC56436.2023.10407647 SF ELIB - SuUB Bremen
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