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1 Ergebnisse
1
Simulation Analysis of Inter-turn Short Circuit Fault of Dr..:
, In:
2023 IEEE 6th International Conference on Automation, Electronics and Electrical Engineering (AUTEEE)
,
Lu, Zhixue
;
Zeng, Leilei
;
Liu, Yang
... - p. 649-652 , 2023
Link:
https://doi.org/10.1109/AUTEEE60196.2023.10408151
RT T1 <cTitle>2023 IEEE 6th International Conference on Automation, Electronics and Electrical Engineering (AUTEEE)</cTitle>: T1 <Title>Simulation Analysis of Inter-turn Short Circuit Fault of Dry-type Air-core Reactor</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10408151&Exemplar=1&LAN=DE A1 Lu, Zhixue A1 Zeng, Leilei A1 Liu, Yang A1 Yan, Nianping A1 Wan, Hua A1 Wang, Peng YR 2023 SN 2831-4549 K1 Insulation K1 Capacitors K1 Windings K1 Software K1 Circuit faults K1 Inductors K1 Integrated circuit modeling K1 dry-type air-core reactor K1 inter-turn short circuit K1 simulation analysis SP 649 OP 652 LK http://dx.doi.org/https://doi.org/10.1109/AUTEEE60196.2023.10408151 DO https://doi.org/10.1109/AUTEEE60196.2023.10408151 SF ELIB - SuUB Bremen
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