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1 Ergebnisse
1
Modified Opposition Method Validation and Analysis for Char..:
, In:
2023 IEEE 8th Southern Power Electronics Conference and 17th Brazilian Power Electronics Conference (SPEC/COBEP)
,
Otton Schneider, Magno
;
Henrique Vieira Araujo, Vitor
;
Riveiro de Oliveira, Thiago
.. - p. 1-7 , 2023
Link:
https://doi.org/10.1109/SPEC56436.2023.10408656
RT T1
2023 IEEE 8th Southern Power Electronics Conference and 17th Brazilian Power Electronics Conference (SPEC/COBEP)
: T1
Modified Opposition Method Validation and Analysis for Characterization of Si IGBT
UL https://suche.suub.uni-bremen.de/peid=ieee-10408656&Exemplar=1&LAN=DE A1 Otton Schneider, Magno A1 Henrique Vieira Araujo, Vitor A1 Riveiro de Oliveira, Thiago A1 Martins Ferreira Morais, Lenin A1 Azevedo Fogli, Gabriel YR 2023 SN 2832-2983 K1 Insulated gate bipolar transistors K1 Current measurement K1 Switching loss K1 Switches K1 Silicon K1 Transistors K1 Method of moments K1 Modified Opposition Method (MOM) K1 Double Pulse Test (DPT) K1 IGBT K1 switching losses K1 inductor losses SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/SPEC56436.2023.10408656 DO https://doi.org/10.1109/SPEC56436.2023.10408656 SF ELIB - SuUB Bremen
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