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1 Ergebnisse
1
From Feature Similarity to Focus Similarity: a Classificati..:
, In:
2023 IEEE 11th Joint International Information Technology and Artificial Intelligence Conference (ITAIC)
,
Hu, Yanxiang
;
Chen, Xinran
;
Gao, Yaru
... - p. 1663-1670 , 2023
Link:
https://doi.org/10.1109/ITAIC58329.2023.10408915
RT T1 <cTitle>2023 IEEE 11th Joint International Information Technology and Artificial Intelligence Conference (ITAIC)</cTitle>: T1 <Title>From Feature Similarity to Focus Similarity: a Classification-Learning Based Multi-Focus Image Fusion Quality Assessment Method</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10408915&Exemplar=1&LAN=DE A1 Hu, Yanxiang A1 Chen, Xinran A1 Gao, Yaru A1 Zhang, Bo A1 Hao, Caixia A1 Sun, Wenhao YR 2023 SN 2693-2865 K1 Measurement K1 Image quality K1 Deep learning K1 Quality assessment K1 Task analysis K1 Information technology K1 Image fusion K1 multi-focus image fusion K1 quality assessment K1 focus classification learning K1 three-classification focus model K1 focus similarity comparison SP 1663 OP 1670 LK http://dx.doi.org/https://doi.org/10.1109/ITAIC58329.2023.10408915 DO https://doi.org/10.1109/ITAIC58329.2023.10408915 SF ELIB - SuUB Bremen
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