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1 Ergebnisse
1
Effect of Heavy Ion Irradiation on SiC MOSFET Dynamic Param..:
, In:
2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Zhang, Chenrui
;
Yu, Qingkui
;
Mei, Bo
... - p. 1-5 , 2022
Link:
https://doi.org/10.1109/RADECS55911.2022.10412380
RT T1
2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS)
: T1
Effect of Heavy Ion Irradiation on SiC MOSFET Dynamic Parameter
UL https://suche.suub.uni-bremen.de/peid=ieee-10412380&Exemplar=1&LAN=DE A1 Zhang, Chenrui A1 Yu, Qingkui A1 Mei, Bo A1 Cao, Shuang A1 Wang, He A1 Wang, Xuesheng A1 Zhang, Teng A1 Liu, Keyu A1 Liu, Shuang A1 Liu, Hainan YR 2022 SN 1609-0438 K1 Radiation effects K1 MOSFET K1 Silicon carbide K1 Logic gates K1 Ions K1 JFETs K1 Reliability K1 SiC MOSFET K1 heavy ions K1 radiation effects K1 gate oxide K1 degradation K1 trap SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/RADECS55911.2022.10412380 DO https://doi.org/10.1109/RADECS55911.2022.10412380 SF ELIB - SuUB Bremen
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