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1 Ergebnisse
1
Ultra-High-Energy Heavy Ion Induced Single Event Effect of ..:
, In:
2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Zhang, Junjun
;
Liu, Fanyu
;
Li, Bo
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/RADECS55911.2022.10412392
RT T1
2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS)
: T1
Ultra-High-Energy Heavy Ion Induced Single Event Effect of TSV-Based 3D Integrated SOI SRAM Circuits
UL https://suche.suub.uni-bremen.de/peid=ieee-10412392&Exemplar=1&LAN=DE A1 Zhang, Junjun A1 Liu, Fanyu A1 Li, Bo A1 Gao, Jiantou A1 Zhao, Peixiong A1 Liu, Jie A1 Luo, Jiajun YR 2022 SN 1609-0438 K1 Three-dimensional displays K1 Sensitivity K1 Random access memory K1 Single event upsets K1 Europe K1 Ions K1 Market research K1 TSV-based 3DIC K1 heavy ion K1 ultra-high energy K1 single event upset K1 angular effect SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/RADECS55911.2022.10412392 DO https://doi.org/10.1109/RADECS55911.2022.10412392 SF ELIB - SuUB Bremen
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