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Heavy-ion and proton characterization of AMD 7nm Versal™ mu..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Maillard, Pierre ; Chen, Yanran P. ; Arver, Jue... - p. 1-6 , 2022
Link: https://doi.org/10.1109/RADECS55911.2022.10412447