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Analysis of Efficiency and Utilization with SRAM Dosimetry ..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Woo, Seungjoo ; Yoon, Raehwan ; Bae, Dongwoo... - p. 1-6 , 2022

Link: https://doi.org/10.1109/RADECS55911.2022.10412449

RT 
T1 <cTitle>2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS)</cTitle>: T1 <Title>Analysis of Efficiency and Utilization with SRAM Dosimetry for Single-Event Effect Evaluation under Irradiation</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-10412449&Exemplar=1&LAN=DE
				
A1 Woo, Seungjoo
A1 Yoon, Raehwan
A1 Bae, Dongwoo
A1 Kim, Kiseog
A1 Lee, Hyeokjae
A1 Chung, Sung S.
A1 Cho, Changhee
A1 Kim, Jeongsoo
A1 Wender, Stephen A.
A1 Kim, Youngboo
YR 2022
SN 1609-0438
K1 Protons
K1 Semiconductor device modeling
K1 Radiation effects
K1 Analytical models
K1 Random access memory
K1 Single event upsets
K1 Semiconductor diodes
K1 quantitative correction factor (Qcrit_eff) ratio
K1 dosimeter
K1 single event effects (SEE)
K1 single event upset (SEU)
K1 static random access memory (SRAM)
K1 SiC power diode
SP 1
OP 6
LK http://dx.doi.org/https://doi.org/10.1109/RADECS55911.2022.10412449
DO https://doi.org/10.1109/RADECS55911.2022.10412449
SF ELIB - SuUB Bremen

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