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Threshold Voltage Shift of SiC MOSFETs Induced by High Temp..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Yu, Qingkui ; Sun, Yi ; Cao, Shuang... - p. 1-5 , 2022
Link: https://doi.org/10.1109/RADECS55911.2022.10412513