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1 Ergebnisse
1
Ionizing Radiation Hardness Characterization of GaN HEMTs D..:
, In:
2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Boas, A.C.V.
;
Alberton, S.G.
;
Medina, N.H.
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/RADECS55911.2022.10412526
RT T1
2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS)
: T1
Ionizing Radiation Hardness Characterization of GaN HEMTs Depends on the Radiation Source
UL https://suche.suub.uni-bremen.de/peid=ieee-10412526&Exemplar=1&LAN=DE A1 Boas, A.C.V. A1 Alberton, S.G. A1 Medina, N.H. A1 Aguiar, V.A. P. A1 Melo, M.A.A. A1 Santos, R.B.B. A1 Giacomini, R.C. A1 Cavalcante, T. V. A1 Seixas, L.E. A1 Finco, S. A1 Palomo, F.R. A1 Guazzelli, M.A. YR 2022 SN 1609-0438 K1 Radiation effects K1 Temperature dependence K1 HEMTs K1 Robustness K1 Behavioral sciences K1 Transistors K1 Photonics K1 GaN HEMT K1 gamma-ray K1 Reliability K1 TID K1 X-ray SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/RADECS55911.2022.10412526 DO https://doi.org/10.1109/RADECS55911.2022.10412526 SF ELIB - SuUB Bremen
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