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1 Ergebnisse
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A RISC-V System-on-Chip with Embedded Adaptive Power–Perfor..:
, In:
2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
de Boissac, Capucine Lecat-Mathieu
;
Abouzeid, Fady
;
Daveau, Jean-Marc
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/RADECS55911.2022.10412550
RT T1
2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS)
: T1
A RISC-V System-on-Chip with Embedded Adaptive Power–Performance–Fault-Tolerance Hardware
UL https://suche.suub.uni-bremen.de/peid=ieee-10412550&Exemplar=1&LAN=DE A1 de Boissac, Capucine Lecat-Mathieu A1 Abouzeid, Fady A1 Daveau, Jean-Marc A1 Bertin, Valerie A1 De-Paoli, Serge A1 Thomet, Sebastien A1 Malherbe, Victor A1 Roche, Philippe A1 Autran, Jean-Luc YR 2022 SN 1609-0438 K1 Voltage measurement K1 Radiation hardening (electronics) K1 Random access memory K1 Frequency estimation K1 System-on-chip K1 Voltage control K1 Frequency control K1 Single-Event Effects K1 Total Ionizing Dose K1 Dynamic Voltage and Frequency Scaling K1 radiation hardening K1 RISC-V K1 Systems-On-Chip K1 Body bias SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/RADECS55911.2022.10412550 DO https://doi.org/10.1109/RADECS55911.2022.10412550 SF ELIB - SuUB Bremen
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