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1 Ergebnisse
1
A highly reliable 1.8 V 1 Mb Hf0.5Zr0.5O2-based 1T1C FeRAM ..:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Okuno, Jun
;
Kunihiro, Takafumi
;
Yonai, Tsubasa
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413661
RT T1
2023 International Electron Devices Meeting (IEDM)
: T1
A highly reliable 1.8 V 1 Mb Hf0.5Zr0.5O2-based 1T1C FeRAM Array with 3-D Capacitors
UL https://suche.suub.uni-bremen.de/peid=ieee-10413661&Exemplar=1&LAN=DE A1 Okuno, Jun A1 Kunihiro, Takafumi A1 Yonai, Tsubasa A1 Ono, Ryo A1 Shuto, Yusuke A1 Alcala, Ruben A1 Lederer, Maximilian A1 Seidel, Konrad A1 Mikolajick, Thomas A1 Schroeder, Uwe A1 Tsukamoto, Masanori A1 Umebayashi, Taku YR 2023 SN 2156-017X K1 Voltage measurement K1 Nonvolatile memory K1 Ferroelectric films K1 Capacitors K1 Random access memory K1 Voltage K1 Reliability SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413661 DO https://doi.org/10.1109/IEDM45741.2023.10413661 SF ELIB - SuUB Bremen
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