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1 Ergebnisse
1
Point-of-Care Testing (POCT) System based on self-Recovery ..:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Zheng, Xu
;
Wu, Lizhou
;
Liu, Yixuan
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413719
RT T1 <cTitle>2023 International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>Point-of-Care Testing (POCT) System based on self-Recovery Memoristor Chip with Low Energy Consuption(1.547 TOPS/W) and High Recognition (1142 fram/s)</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10413719&Exemplar=1&LAN=DE A1 Zheng, Xu A1 Wu, Lizhou A1 Liu, Yixuan A1 Wu, Qiqiao A1 Xie, Yuanlu A1 Li, Yi A1 Lai, Jinru A1 Sun, Wenxuan A1 Dong, Danian A1 Yu, Jie A1 Xu, Xiaoxin A1 Zhang, Wenchang A1 Liu, Ming YR 2023 SN 2156-017X K1 Degradation K1 Power demand K1 Point of care K1 Memristors K1 Security K1 Reliability K1 Testing SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413719 DO https://doi.org/10.1109/IEDM45741.2023.10413719 SF ELIB - SuUB Bremen
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