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1 Ergebnisse
1
3-STAR: A Super-steep switching, Stackable, and Strongly Re..:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Lee, Kynghwan
;
Yoo, Sungwon
;
Hong, Jaeho
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413741
RT T1
2023 International Electron Devices Meeting (IEDM)
: T1
3-STAR: A Super-steep switching, Stackable, and Strongly Reliable Transistor Array RAM for Sub-10nm DRAM and beyond
UL https://suche.suub.uni-bremen.de/peid=ieee-10413741&Exemplar=1&LAN=DE A1 Lee, Kynghwan A1 Yoo, Sungwon A1 Hong, Jaeho A1 Kim, Hyun-Cheol A1 Kim, YongSeok A1 Kim, Ilgweon A1 Ha, Daewon A1 Shin, Yu-Gyun A1 Song, Jaihyuk YR 2023 SN 2156-017X K1 Nonvolatile memory K1 Random access memory K1 Switches K1 Logic gates K1 Silicon K1 Behavioral sciences K1 Switching circuits SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413741 DO https://doi.org/10.1109/IEDM45741.2023.10413741 SF ELIB - SuUB Bremen
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