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1 Ergebnisse
1
High Performance Nanosheet Technology Optimized for 77 K:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Bao, R.
;
Qin, L.
;
Frougier, J.
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413745
RT T1 <cTitle>2023 International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>High Performance Nanosheet Technology Optimized for 77 K</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10413745&Exemplar=1&LAN=DE A1 Bao, R. A1 Qin, L. A1 Frougier, J. A1 Suk, S. A1 Rabie, M. A1 Bajpai, U. A1 Chou, A. A1 Nechay, B. A1 Mohamed, M. A1 Pujari, R. A1 Weir, T. J A1 Harmon, K. A1 Varma, A. A1 Armstrong-Moore, W. A1 Cestero, A. A1 Emans, S. A1 Hundekar, P. A1 Joshi, R. A1 Li, J. A1 Liu, X. A1 Lucarini, S. A1 Radens, C. A1 Siddiqui, S. A1 Trombley, H. A1 Bryant, A. A1 Hasanuzzaman, M. A1 Majumdar, A. A1 Sung, M. A1 Zhang, J. A1 Leobandung, E. YR 2023 SN 2156-017X K1 Performance evaluation K1 Sensitivity K1 Performance gain K1 Ions K1 Nanoscale devices K1 Junctions K1 Optimization SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413745 DO https://doi.org/10.1109/IEDM45741.2023.10413745 SF ELIB - SuUB Bremen
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