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Charge Movement in Back Barrier Induced Time-Dependent On-S..:

, In: 2023 International Electron Devices Meeting (IEDM),
Yu, Hao ; Fang, J. ; Vermeersch, B.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/IEDM45741.2023.10413747