I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Improved Multi-bit Statistics of Novel Dual-gate IGZO 2T0C ..:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Chen, Kaifei
;
Zhu, Zhengyong
;
Lu, Wendong
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413770
RT T1
2023 International Electron Devices Meeting (IEDM)
: T1
Improved Multi-bit Statistics of Novel Dual-gate IGZO 2T0C DRAM with In-cell VTH Compensation and ΔVSN/ΔVDATA Boosting Technique
UL https://suche.suub.uni-bremen.de/peid=ieee-10413770&Exemplar=1&LAN=DE A1 Chen, Kaifei A1 Zhu, Zhengyong A1 Lu, Wendong A1 Liu, Menggan A1 Liao, Fuxi A1 Wu, Zijing A1 Niu, Jiebin A1 Kang, Bok-Moon A1 Dan, Wang A1 Wu, Xie-Shuai A1 Liu, Ming-Xu A1 Yu, Yong A1 Yang, Nan A1 Wang, Gui-Lei A1 Cao, Kan-Yu A1 Wang, Lingfei A1 Geng, Di A1 Lu, Nianduan A1 Yang, Guanhua A1 Zhao, Chao A1 Nathan, Arokia A1 Li, Ling A1 Liu, Ming YR 2023 SN 2156-017X K1 Random access memory K1 Voltage K1 Writing K1 Benchmark testing K1 Boosting K1 Transistors K1 Standards SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413770 DO https://doi.org/10.1109/IEDM45741.2023.10413770 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)