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Power-Efficient Clustering Using Programmable VT FETs in Ne..:

, In: 2023 International Electron Devices Meeting (IEDM),
Barve, S. ; Haehn, N. ; Socolik, C.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/IEDM45741.2023.10413791