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1 Ergebnisse
1
N3XT 3D Technology Foundations and Their Lab-to-Fab: Omni 3..:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Srimani, T.
;
Bechdolt, A.
;
Choi, S.
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413794
RT T1 <cTitle>2023 International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>N3XT 3D Technology Foundations and Their Lab-to-Fab: Omni 3D Logic, Logic+Memory Ultra-Dense 3D, 3D Thermal Scaffolding</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10413794&Exemplar=1&LAN=DE A1 Srimani, T. A1 Bechdolt, A. A1 Choi, S. A1 Gilardi, C. A1 Kasperovich, A. A1 Li, S. A1 Lin, Q. A1 Malakoutian, M. A1 McEwen, P. A1 Radway, R.M. A1 Rich, D. A1 Yu, A.C. A1 Fuller, S. A1 Achour, S. A1 Chowdhury, S. A1 Wong, H.-S. P. A1 Shulaker, M. A1 Mitra, S. YR 2023 SN 2156-017X K1 Three-dimensional displays K1 Industrial facilities K1 Delays K1 Electron devices SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413794 DO https://doi.org/10.1109/IEDM45741.2023.10413794 SF ELIB - SuUB Bremen
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