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1 Ergebnisse
1
HyFET—A GaN/SiC Hybrid Field-Effect Transistor:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Feng, Sirui
;
Zheng, Zheyang
;
Wang, Yuru
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413796
RT T1
2023 International Electron Devices Meeting (IEDM)
: T1
HyFET—A GaN/SiC Hybrid Field-Effect Transistor
UL https://suche.suub.uni-bremen.de/peid=ieee-10413796&Exemplar=1&LAN=DE A1 Feng, Sirui A1 Zheng, Zheyang A1 Wang, Yuru A1 Lyu, Gang A1 Liu, Kai A1 Cheng, Yan A1 Chen, Junting A1 Chen, Tao A1 Zhang, Li A1 Song, Wenjie A1 Liao, Hang A1 Ng, Yat Hon A1 Hua, Mengyuan A1 Cheng, Kai A1 Wei, Jin A1 Chen, Kevin J. YR 2023 SN 2156-017X K1 Performance evaluation K1 Silicon carbide K1 HEMTs K1 JFETs K1 Transistors K1 MODFETs K1 Electron devices SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413796 DO https://doi.org/10.1109/IEDM45741.2023.10413796 SF ELIB - SuUB Bremen
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