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1 Ergebnisse
1
ESD Reliability in Advanced Nodes:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Poon, Steven S.
;
Kao, Ming-Hong
;
Chang, Wei-Chao
. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413811
RT T1 <cTitle>2023 International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>ESD Reliability in Advanced Nodes</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10413811&Exemplar=1&LAN=DE A1 Poon, Steven S. A1 Kao, Ming-Hong A1 Chang, Wei-Chao A1 Huang, Teng-Fu YR 2023 SN 2156-017X K1 Electrostatic discharges K1 Reliability K1 Electron devices K1 Standards K1 Testing K1 Qualifications SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413811 DO https://doi.org/10.1109/IEDM45741.2023.10413811 SF ELIB - SuUB Bremen
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