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1 Ergebnisse
1
Comprehensive Study of NBTI and Off-State Reliabilty in Sub..:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Sun, Zixuan
;
Cai, Puyang
;
Song, Jiahao
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413817
RT T1
2023 International Electron Devices Meeting (IEDM)
: T1
Comprehensive Study of NBTI and Off-State Reliabilty in Sub-20 nm DRAM Technology: Trap Identification, Compact Aging Model, and Impact on Retention Degradation
UL https://suche.suub.uni-bremen.de/peid=ieee-10413817&Exemplar=1&LAN=DE A1 Sun, Zixuan A1 Cai, Puyang A1 Song, Jiahao A1 Wang, Da A1 Liu, Zhuyou A1 Zhou, Longda A1 Zhu, Tianxiang A1 Xue, Yongkang A1 Liu, Yong A1 Wang, Zirui A1 Luo, Junwei A1 Deng, Huixiong A1 Wang, Yuan A1 Ji, Zhigang A1 Wang, Runsheng A1 Huang, Ru YR 2023 SN 2156-017X K1 Degradation K1 Electron traps K1 Thermal variables control K1 Random access memory K1 Aging K1 Energy states K1 Stress SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413817 DO https://doi.org/10.1109/IEDM45741.2023.10413817 SF ELIB - SuUB Bremen
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