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1 Ergebnisse
1
BEOL Compatible Oxide Power Transistors for On- Chip Voltag..:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Deng, Sunbin
;
Kwak, Jungyoun
;
Lee, Junmo
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413838
RT T1
2023 International Electron Devices Meeting (IEDM)
: T1
BEOL Compatible Oxide Power Transistors for On- Chip Voltage Conversion in Heterogenous 3D (H3D) Integrated Circuits
UL https://suche.suub.uni-bremen.de/peid=ieee-10413838&Exemplar=1&LAN=DE A1 Deng, Sunbin A1 Kwak, Jungyoun A1 Lee, Junmo A1 Aabrar, Khandker Akif A1 Kim, Tae-Hyeon A1 Choe, Gihun A1 Kirtania, Sharadindu Gopal A1 Zhang, Chengyang A1 Li, Wantong A1 Phadke, Omkar A1 Yu, Shimeng A1 Datta, Suman YR 2023 SN 2156-017X K1 Voltage measurement K1 Power measurement K1 Capacitors K1 Superlattices K1 DC-DC power converters K1 Power transistors K1 Transformers SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413838 DO https://doi.org/10.1109/IEDM45741.2023.10413838 SF ELIB - SuUB Bremen
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