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1 Ergebnisse
1
Thermal Management in Multi-Finger GaN-on-Si HEMTs: Underst..:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Jeong, Jaeyong
;
Choi, Sung Joon
;
Shim, Joonsup
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413841
RT T1
2023 International Electron Devices Meeting (IEDM)
: T1
Thermal Management in Multi-Finger GaN-on-Si HEMTs: Understanding and Mitigating Self-Heating and Thermal Crosstalk for Enhanced Device Reliability
UL https://suche.suub.uni-bremen.de/peid=ieee-10413841&Exemplar=1&LAN=DE A1 Jeong, Jaeyong A1 Choi, Sung Joon A1 Shim, Joonsup A1 Kim, Eunjung A1 Kim, Seong Kwang A1 Kim, Bong Ho A1 Kim, Joon Pyo A1 Suh, Yoon-Je A1 Beak, Woo Jin A1 Geum, Dae-Myeong A1 Koh, Yumin A1 Kim, Donghyun A1 Kim, SangHyeon YR 2023 SN 2156-017X K1 Degradation K1 Fingers K1 Crosstalk K1 HEMTs K1 Reliability K1 MODFETs K1 Stress SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413841 DO https://doi.org/10.1109/IEDM45741.2023.10413841 SF ELIB - SuUB Bremen
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