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1 Ergebnisse
1
Defying Temperature: Reliable Compute-in-Memory in Monolith..:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Chatterjee, Swetaki
;
Kumar, Shubham
;
Sunil, Athira
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413851
RT T1
2023 International Electron Devices Meeting (IEDM)
: T1
Defying Temperature: Reliable Compute-in-Memory in Monolithic 3D using BEOL Ferroelectric TFT
UL https://suche.suub.uni-bremen.de/peid=ieee-10413851&Exemplar=1&LAN=DE A1 Chatterjee, Swetaki A1 Kumar, Shubham A1 Sunil, Athira A1 De, Sourav A1 Lehninger, David A1 Jank, Michael A1 Kampfe, Thomas A1 Chauhan, Yogesh Singh A1 Amrouch, Hussam YR 2023 SN 2156-017X K1 Temperature measurement K1 Temperature sensors K1 Temperature distribution K1 Solid modeling K1 Three-dimensional displays K1 Thin film transistors K1 Sensors SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413851 DO https://doi.org/10.1109/IEDM45741.2023.10413851 SF ELIB - SuUB Bremen
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