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Comparative Advantages of 2T-nC FeRAM in Empowering High De..:

, In: 2023 International Electron Devices Meeting (IEDM),
Deng, Shan ; Xiao, Yi ; Zhao, Zijian... - p. 1-4 , 2023
Link: https://doi.org/10.1109/IEDM45741.2023.10413855