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1 Ergebnisse
1
Comprehensive Understanding of Flicker Noise in Advanced Fi..:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Wu, Junjie
;
Ren, Pengpeng
;
Zhang, Chenyang
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413861
RT T1
2023 International Electron Devices Meeting (IEDM)
: T1
Comprehensive Understanding of Flicker Noise in Advanced FinFET Technology: from Noise Sources Separation to Physical-based Modeling
UL https://suche.suub.uni-bremen.de/peid=ieee-10413861&Exemplar=1&LAN=DE A1 Wu, Junjie A1 Ren, Pengpeng A1 Zhang, Chenyang A1 Xiao, Yu A1 Xue, Yongkang A1 Li, Yu A1 Wang, Xiaolin A1 Zhang, Lining A1 Liu, Junhua A1 Zhang, Jianfu A1 Wang, Runsheng A1 Ji, Zhigang A1 Huang, Ru YR 2023 SN 2156-017X K1 Resistance K1 Predictive models K1 FinFETs K1 Data models K1 1/f noise K1 Data mining K1 Integrated circuit modeling SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413861 DO https://doi.org/10.1109/IEDM45741.2023.10413861 SF ELIB - SuUB Bremen
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