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1 Ergebnisse
1
High-Endurance MoS2 FeFET with Operating Voltage Fess Than ..:
, In:
2023 International Electron Devices Meeting (IEDM)
,
Lee, Tsung-En
;
Chiang, Hung-Li
;
Chang, Chih-Yu
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IEDM45741.2023.10413873
RT T1
2023 International Electron Devices Meeting (IEDM)
: T1
High-Endurance MoS2 FeFET with Operating Voltage Fess Than IV for eNVM in Scaled CMOS Technologies
UL https://suche.suub.uni-bremen.de/peid=ieee-10413873&Exemplar=1&LAN=DE A1 Lee, Tsung-En A1 Chiang, Hung-Li A1 Chang, Chih-Yu A1 Su, Yuan-Chun A1 Chang, Shu-Jui A1 Wu, Jui-Jen A1 Lin, Bo-Jiun A1 Wang, Jer-Fu A1 Haw, Shu-Chih A1 Chiu, Shang-Jui A1 Ching, He-Liang A1 Lin, Yan-Gu A1 Yun, Wei-Sheng A1 Hsu, Chen-Feng A1 Lee, Hengyuan A1 Lee, Tung-Ying A1 Passlack, Matthias A1 Cheng, Chao-Ching A1 Chang, Chih-Sheng A1 Wong, H.-S. Philip A1 Chang, Wen-Hao A1 Chang, Meng-Fan A1 Lin, Yu-Ming A1 Radu, Iuliana P. YR 2023 SN 2156-017X K1 Temperature measurement K1 Semiconductor device measurement K1 CMOS technology K1 Sulfur K1 Transistors K1 Molybdenum K1 FeFETs SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM45741.2023.10413873 DO https://doi.org/10.1109/IEDM45741.2023.10413873 SF ELIB - SuUB Bremen
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