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Detección de Falla en Máquina de Inducción Mediante Análisi..:

, In: 2023 IEEE CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies (CHILECON),
Munoz, Viviana ; Juan, Enrique San ; Adasme, Pablo... - p. 1-6 , 2023
Link: https://doi.org/10.1109/CHILECON60335.2023.10418774