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Research on the Trip Characteristics of High-Voltage Circui..:
, In:
2023 5th International Conference on Electrical Engineering and Control Technologies (CEECT)
,
Wenxing, Sun
;
Chi, Zhang
;
Congwei, Yao
.. - p. 474-478 , 2023
Link:
https://doi.org/10.1109/CEECT59667.2023.10420726
RT T1 <cTitle>2023 5th International Conference on Electrical Engineering and Control Technologies (CEECT)</cTitle>: T1 <Title>Research on the Trip Characteristics of High-Voltage Circuit Breakers Based on Chaos System Theory</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10420726&Exemplar=1&LAN=DE A1 Wenxing, Sun A1 Chi, Zhang A1 Congwei, Yao A1 Shuai, Sun A1 Yingjie, Yan YR 2023 K1 Circuit breakers K1 Friction K1 High-voltage techniques K1 Maintenance engineering K1 Integrated circuit modeling K1 Springs K1 Monitoring K1 high voltage circuit breaker K1 trip time K1 chaos system theory K1 operating model K1 warning strategy SP 474 OP 478 LK http://dx.doi.org/https://doi.org/10.1109/CEECT59667.2023.10420726 DO https://doi.org/10.1109/CEECT59667.2023.10420726 SF ELIB - SuUB Bremen
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