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1 Ergebnisse
1
Investigation of Cylindrical Gate All Around Field Effect T..:
, In:
2023 International Conference on Next Generation Electronics (NEleX)
,
Krishna, Raji
;
Srujana, B.
;
Jayanthi, D.
.. - p. 1-5 , 2023
Link:
https://doi.org/10.1109/NEleX59773.2023.10421607
RT T1 <cTitle>2023 International Conference on Next Generation Electronics (NEleX)</cTitle>: T1 <Title>Investigation of Cylindrical Gate All Around Field Effect Transistors Exploring Variation in Low Voltage Using Visual TCAD</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10421607&Exemplar=1&LAN=DE A1 Krishna, Raji A1 Srujana, B. A1 Jayanthi, D. A1 Kavitha, K. A1 Maurya, Naveen YR 2023 K1 Performance evaluation K1 Visualization K1 Field effect transistors K1 Logic gates K1 FinFETs K1 Threshold voltage K1 Leakage currents K1 Gate-All-Around Field Effect Transistor K1 Drain Induced Barrier Lowering K1 Sub-Threshold Swing SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/NEleX59773.2023.10421607 DO https://doi.org/10.1109/NEleX59773.2023.10421607 SF ELIB - SuUB Bremen
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