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1 Ergebnisse
1
Comparative Study of Thin Film Transistor Configurations Us..:
, In:
2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)
,
Anjana, J G
;
Nair, Anantha Krishna J
;
Govind, G
.. - p. 1-5 , 2023
Link:
https://doi.org/10.1109/IEMENTech60402.2023.10423533
RT T1 <cTitle>2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)</cTitle>: T1 <Title>Comparative Study of Thin Film Transistor Configurations Using TCAD</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10423533&Exemplar=1&LAN=DE A1 Anjana, J G A1 Nair, Anantha Krishna J A1 Govind, G A1 Johnson, Sangeeth A1 Nair, Adarsh M YR 2023 SN 2767-9934 K1 Electrodes K1 Resistance K1 Transmission line matrix methods K1 Logic gates K1 Thin film transistors K1 Electric fields K1 RFID tags K1 Staggered TFTs K1 Coplanar TFTs K1 Top-Gated TFTs K1 Electronic concentration K1 Semiconductor Devices K1 TFT Configurations K1 Bottom-Gated TFTs K1 Electric field SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IEMENTech60402.2023.10423533 DO https://doi.org/10.1109/IEMENTech60402.2023.10423533 SF ELIB - SuUB Bremen
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